DocumentCode :
3239023
Title :
Dynamic Voltage Scaling of Supply and Body Bias Exploiting Software Runtime Distribution
Author :
Hong, Sungpack ; Yoo, Sungjoo ; Byeong Bin ; Choi, Kyu-Myung ; Eo, Soo-Kwan ; Kim, Taehwan
Author_Institution :
Dept. fo EE, Stanford Univ., Stanford, CA
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
242
Lastpage :
247
Abstract :
This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumption exploiting the runtime distribution of software execution. We present a mathematical formulation of the DVS problem and an efficient numerical solution. Experimental results show that the presented method shows up to 44% further reduction in energy consumption compared with existing methods. Especially, when the leakage power consumption is significant, i.e. when temperature is high, the presented method is proven to be the most effective.
Keywords :
logic design; microprocessor chips; dynamic voltage scaling; energy consumption; leakage power consumption; software execution; software runtime distribution; switching power; Constraint optimization; Dynamic voltage scaling; Energy consumption; Frequency estimation; Optimization methods; Runtime; Software performance; Statistical analysis; Temperature; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484693
Filename :
4484693
Link To Document :
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