Title :
Dynamic Voltage Scaling of Supply and Body Bias Exploiting Software Runtime Distribution
Author :
Hong, Sungpack ; Yoo, Sungjoo ; Byeong Bin ; Choi, Kyu-Myung ; Eo, Soo-Kwan ; Kim, Taehwan
Author_Institution :
Dept. fo EE, Stanford Univ., Stanford, CA
Abstract :
This paper presents a method of dynamic voltage scaling (DVS) that tackles both switching and leakage power with combined Vdd/Vbs scaling and gives minimum average energy consumption exploiting the runtime distribution of software execution. We present a mathematical formulation of the DVS problem and an efficient numerical solution. Experimental results show that the presented method shows up to 44% further reduction in energy consumption compared with existing methods. Especially, when the leakage power consumption is significant, i.e. when temperature is high, the presented method is proven to be the most effective.
Keywords :
logic design; microprocessor chips; dynamic voltage scaling; energy consumption; leakage power consumption; software execution; software runtime distribution; switching power; Constraint optimization; Dynamic voltage scaling; Energy consumption; Frequency estimation; Optimization methods; Runtime; Software performance; Statistical analysis; Temperature; Voltage control;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484693