Title :
Optical Detection of Bent Pins in a High-Density Array
Author :
Voyles, Richard M., Jr.
Author_Institution :
IBM Corporation
Keywords :
Assembly; Inspection; Laser beams; Optical arrays; Optical detectors; Optical diffraction; Pins; Production; Prototypes; Robots;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716390
