DocumentCode
3239216
Title
Scaling laws and performance limitations of power turn-off devices
Author
Jaecklin, André A. ; Adam, Bruno
Author_Institution
Asea Brown Boveri Ltd., Lenzberg, Switzerland
fYear
1989
fDate
26-29 Jun 1989
Firstpage
337
Abstract
The performance of multiple-cell devices is limited by a redistribution of current during turn-off because minor differences between the otherwise identical cells seem to become important. A simple model based on Gaussian statistics gives a quantitative explanation of this phenomenon for the first time. For the example of a gate turn-off thyristor (GTO) it leads to an approximate square-root scaling of turn-off current with device size. Good agreement with experimental results is found. The model is not GTO-specific and may cover other devices as well
Keywords
thyristors; GTO; Gaussian statistics; gate turn-off thyristor; performance limitations; scaling laws; Charge carrier lifetime; Circuits; Electric breakdown; Low voltage; Performance analysis; Physics; Silicon; Statistical distributions; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1989. PESC '89 Record., 20th Annual IEEE
Conference_Location
Milwaukee, WI
Type
conf
DOI
10.1109/PESC.1989.48507
Filename
48507
Link To Document