DocumentCode :
3239253
Title :
Towards fault tolerant parallel prefix adders in nanoelectronic systems
Author :
Rao, Wenjing ; Orailoglu, Alex
Author_Institution :
Dept. of CSE, UC San Diego, La Jolla, CA
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
360
Lastpage :
365
Abstract :
Future nanoelectronics based arithmetic components will enjoy abundant hardware, yet at the same time confront severe unreliability challenges. We focus on the fault tolerance of high performance parallel prefix adders (PPA), and exploit the inherent redundancy in PPAs to develop efficient fault tolerance approaches. We show that the internal invariant inherent in the parallel prefix adders provides support for online fault detection and fault masking. Furthermore, based on the particular regular structure of PPAs, an online diagnosis scheme can be developed, thus enabling the application of reconfigurability of nanoelectronics for the highly flexible online repair approaches. In contrast to traditional fault tolerance techniques that rely solely on significant external overhead, the proposed approach opens up a new genre of efficient fault tolerance techniques for arithmetic components in the nanoelectronic environment.
Keywords :
adders; fault diagnosis; fault tolerance; nanoelectronics; redundancy; PPA redundancy; fault masking; fault tolerant parallel prefix adders; nanoelectronic based arithmetic components; online fault detection; Arithmetic; Crosstalk; Fabrication; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Nanoscale devices; Quantum cellular automata; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484706
Filename :
4484706
Link To Document :
بازگشت