DocumentCode
3239410
Title
Characterising the turn-off performance of multi-cathode GTO thyristors using thermal imaging
Author
Palmer, P.R. ; Johnson, C.M.
Author_Institution
Dept. of Eng., Cambridge Univ., UK
fYear
1989
fDate
26-29 Jun 1989
Firstpage
343
Abstract
The thermal imaging of a GTO (gate turn-off thyristor) switching high currents is described. Results show that under certain gate drive and anode-cathode voltage conditions at turn-off, the anode current redistributes between cathode islands, greatly stressing some islands. From this, conclusions are drawn concerning GTO rating and circuit design
Keywords
infrared imaging; thyristors; anode-cathode voltage conditions; multi-cathode GTO thyristors; switching high currents; thermal imaging; turn-off performance; Anodes; Cathodes; Circuit testing; Clamps; Switching circuits; Switching loss; Temperature measurement; Thermal engineering; Thyristors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1989. PESC '89 Record., 20th Annual IEEE
Conference_Location
Milwaukee, WI
Type
conf
DOI
10.1109/PESC.1989.48508
Filename
48508
Link To Document