• DocumentCode
    3239427
  • Title

    A Mutation Model for the SystemC TLM 2.0 Communication Interfaces

  • Author

    Bombieri, Nicola ; Fummi, Franco ; Pravadelli, Graziano

  • Author_Institution
    Dipt. di Inf., Univ. di Verona, Verona
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    396
  • Lastpage
    401
  • Abstract
    Mutation analysis is a widely-adopted strategy in software testing with two main purposes: measuring the quality of test suites, and identifying redundant code in programs. Similar approaches are applied in hardware verification and testing too, especially at RTL or gate level, where mutants are generally referred as faults, and mutation analysis is performed by means of fault modeling and fault simulation. However, in modern embedded systems there is a close integration between HW and SW parts, and verification strategies should be applied early in the design flow. This requires the definition of new mutation analysis-based strategies that work at system level, where HW and SW functionalities are not partitioned yet. In this context, the paper proposes a mutation model for perturbing transaction level modeling (TLM) SystemC descriptions. In particular, the main constructs provided by the SystemC TLM 2.0 library have been analyzed, and a set of mutants is proposed to perturb the primitives related to the TLM communication interfaces.
  • Keywords
    embedded systems; formal verification; hardware-software codesign; logic design; SystemC TLM 2.0 communication interfaces; SystemC descriptions; design flow; embedded systems; fault modeling; fault simulation; gate level; hardware testing; hardware verification; mutation analysis; mutation model; redundant code; software testing; system level; test suites; transaction level modeling; verification strategies; Analytical models; Context modeling; Embedded system; Genetic mutations; Hardware; Libraries; Performance analysis; Performance evaluation; Software measurement; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484713
  • Filename
    4484713