Title :
Optimal neyman-pearson classification under Bayesian uncertainty models
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Abstract :
A Bayesian modeling framework over an uncertainty class of underlying distributions has been used to derive an optimal MMSE error estimator for arbitrary classifiers and an optimal Bayesian classification rule that minimizes expected error, both relative to the overall misclassification rate. In this work, we use the same Bayesian framework to formulate a Neyman-Pearson based approach that optimizes relative to true and false positive rates. True and false positive rates are often of more practical use than the misclassification rate in medical applications, meanwhile the Neyman-Pearson theory does not require modeling or knowledge of the prior class probabilities.
Keywords :
Bayes methods; least mean squares methods; medical computing; pattern classification; Bayesian modeling framework; Bayesian uncertainty models; arbitrary classifiers; expected error minimization; false positive rates; medical applications; optimal Bayesian classification rule; optimal MMSE error estimator; optimal Neyman-Pearson classification; true positive rates; Bayes methods; Biological system modeling; Computational modeling; Error analysis; Estimation; Tin; Uncertainty; Bayesian estimation; Classification; Neyman-Pearson; false positive rate; true positive rate;
Conference_Titel :
Genomic Signal Processing and Statistics (GENSIPS), 2013 IEEE International Workshop on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4799-3461-4
DOI :
10.1109/GENSIPS.2013.6735943