• DocumentCode
    3239874
  • Title

    Low frequency mobility effects on MESFET device

  • Author

    Rodriguez-Tellez, J. ; Ali, Nt ; Fernandez, T. ; Mediavilla, A. ; Tazon, A. ; Guillermo, A.

  • Volume
    2
  • fYear
    2002
  • fDate
    25-28 Nov. 2002
  • Firstpage
    1194
  • Abstract
    In a previous paper [2001] the observed differences between the static and dynamic IV characteristics of a MESFET were attributed to electric field and frequency effects. In this paper, such dependencies have been accounted for via the mobility figure. The results show a strong relationship between the mobility figure and both the frequency and the electric field (gate voltage).
  • Keywords
    Schottky gate field effect transistors; carrier mobility; characteristics measurement; semiconductor device measurement; MESFET device; dynamic IV characteristics; electric field; frequency; gate voltage; low frequency mobility effects; mobility figure; static IV characteristics; Capacitance; Educational institutions; Fingers; Frequency measurement; Gallium arsenide; Heating; MESFETs; Pulse measurements; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Systems, 2002. ICCS 2002. The 8th International Conference on
  • Print_ISBN
    0-7803-7510-6
  • Type

    conf

  • DOI
    10.1109/ICCS.2002.1183322
  • Filename
    1183322