• DocumentCode
    3240007
  • Title

    Fault propagation pattern based relevant faulty ciphertexts filtering towards DFA on AES

  • Author

    Wang, Na ; Zhou, Yongbin

  • Author_Institution
    State Key Lab. of Inf. Security, Chinese Acad. of Sci., Beijing, China
  • fYear
    2011
  • fDate
    27-29 May 2011
  • Firstpage
    208
  • Lastpage
    214
  • Abstract
    Basically, Differential Fault Analysis (DFA) against ciphers consists of two stages: fault induction and fault exploitation. Success rate of the latter strongly depends upon the availability of the required type of some faulty ciphertexts, which typically assumes that adversaries have precise control over the location, timing and/or even the type of the fault induced. In view of this, there seems to be a technical gap between these two stages. In this paper, by amplifying the fault propagation pattern inherent in block ciphers, we propose an algorithmic method to narrow this gap, or to relax the underlying assumption. Our method provides a faulty ciphertext filtering process between two basic stages in DFA. This additional process equips adversaries with the capabilities to deterministically decide whether or not one faulty ciphertext is relevant to a specific DFA, before or without performing DFA itself. We take AES as a concrete case of study and conduct theoretical analysis and simulation experiments as well, the results of which strongly demonstrate the validity and power of our proposed filtering method.
  • Keywords
    cryptography; fault tolerant computing; information filtering; text analysis; AES; DFA; block ciphers; differential fault analysis; fault exploitation; fault induction; fault propagation pattern; relevant faulty ciphertext filtering; Artificial intelligence; Cryptography; Doped fiber amplifiers; Information filters; AES; Differential Fault Analysis; Fault Propagation Pattern; Filtering; Relevant Faulty Ciphertext;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Software and Networks (ICCSN), 2011 IEEE 3rd International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-61284-485-5
  • Type

    conf

  • DOI
    10.1109/ICCSN.2011.6014707
  • Filename
    6014707