Title :
Characterizing the Igs(Vgs) Nonlinearity for Describing its Contribution to FET Large-signal Intermodulation Distortion
Author :
Garcia, Jose A. ; Aballo, T. ; Mediavilla, A. ; Tazon, A.
Author_Institution :
Dept. Commun. Eng., Cantabria Univ., Santander
Abstract :
In this paper, a simple experimental procedure for extracting the Igs(Vgs) Taylor-series coefficients along a load line is presented, as a way to accurately characterize its contribution to FET large-signal intermodulation distortion (IMD) behaviour
Keywords :
Volterra series; field effect transistors; intermodulation distortion; FET large-signal intermodulation distortion; Taylor-series coefficients; Volterra series; nonlinear distortion; semiconductor device measurement; Distortion measurement; Equivalent circuits; FETs; Frequency measurement; Harmonic distortion; Intermodulation distortion; Linearity; Power amplifiers; Roentgenium; Testing; FETs; Volterra series; nonlinear distortion; semiconductor device measurement;
Conference_Titel :
Integrated Nonlinear Microwave and Millimeter-Wave Circuits, 2006 International Workshop on
Conference_Location :
Aveiro
Print_ISBN :
0-7803-9723-1
Electronic_ISBN :
0-7803-9723-1
DOI :
10.1109/INMMIC.2006.283514
