• DocumentCode
    3240097
  • Title

    Characterizing the Igs(Vgs) Nonlinearity for Describing its Contribution to FET Large-signal Intermodulation Distortion

  • Author

    Garcia, Jose A. ; Aballo, T. ; Mediavilla, A. ; Tazon, A.

  • Author_Institution
    Dept. Commun. Eng., Cantabria Univ., Santander
  • fYear
    2006
  • fDate
    30-31 Jan. 2006
  • Firstpage
    80
  • Lastpage
    83
  • Abstract
    In this paper, a simple experimental procedure for extracting the Igs(Vgs) Taylor-series coefficients along a load line is presented, as a way to accurately characterize its contribution to FET large-signal intermodulation distortion (IMD) behaviour
  • Keywords
    Volterra series; field effect transistors; intermodulation distortion; FET large-signal intermodulation distortion; Taylor-series coefficients; Volterra series; nonlinear distortion; semiconductor device measurement; Distortion measurement; Equivalent circuits; FETs; Frequency measurement; Harmonic distortion; Intermodulation distortion; Linearity; Power amplifiers; Roentgenium; Testing; FETs; Volterra series; nonlinear distortion; semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Nonlinear Microwave and Millimeter-Wave Circuits, 2006 International Workshop on
  • Conference_Location
    Aveiro
  • Print_ISBN
    0-7803-9723-1
  • Electronic_ISBN
    0-7803-9723-1
  • Type

    conf

  • DOI
    10.1109/INMMIC.2006.283514
  • Filename
    4062265