DocumentCode
3240251
Title
Comparison of Opamp-Based and Comparator-Based Delta-Sigma Modulation
Author
Momeni, Massoud ; Bacinschi, Petru Bogdan ; Glesner, Manfred
Author_Institution
Dept. of Electr. Eng. & Inf. Technol., Tech. Univ. Darmstadt, Darmstadt
fYear
2008
fDate
10-14 March 2008
Firstpage
688
Lastpage
693
Abstract
Comparator-based switched capacitor (CBSC) circuits present an alternative approach to designing sampled data systems based on the principle of detecting a virtual ground condition with a comparator rather than actively enforcing it with a high-gain operational amplifier (opamp) in feedback. This work demonstrates a 2nd-order DeltaSigma converter designed using the CBSC technique. The same modulator topology was also implemented using two conventional design methods for a two-stage Miller-compensated amplifier and a single-stage folded cascode amplifier, such that all three blocks can be used as ´drop-in replacements´ in the top-level circuit. The designs are done in a 0.13 mum UMC technology. The SNDR performance and power consumption of all three approaches were simulated with a sampling frequency of 5.12 MHz and an oversampling ratio of 64. It can be concluded that the CBSC method provides a great simplification of design effort and significant power savings compared to the traditional OTA-based methods.
Keywords
comparators (circuits); delta-sigma modulation; operational amplifiers; switched capacitor networks; CBSC; Miller-compensated amplifier; SNDR performance; UMC technology; comparator-based switched capacitor circuits; delta-sigma modulation; feedback; frequency 5.12 MHz; operational amplifiers; power consumption; sampled data systems; second-order delta-sigma modulator; single-stage folded cascode amplifier; size 0.13 micron; Circuit simulation; Circuit topology; Delta-sigma modulation; Design methodology; Energy consumption; Feedback circuits; Operational amplifiers; Sampled data systems; Switched capacitor circuits; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484758
Filename
4484758
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