Title :
Volume-based reasoning and visualization of diecastability
Author :
Yagel, R. ; Lu, S.C. ; Rebello, A.B. ; Miller, R.A.
Author_Institution :
Dept. of Comput. & Inf. Sci., Ohio State Univ., Columbus, OH, USA
fDate :
29 Oct-3 Nov 1995
Abstract :
Because of the nature of the die casting process, the part geometry severely restricts the die geometry and hence affects the quality of the part. However, as is often the case in other manufacturing processes, diecastings are currently designed purely based on their function. The manufacturability of the diecastings is not considered until the design has been nearly completed and detailed. This is due to the design support limitations of current CAE tools. We present a new volume-based approach to support diecastability evaluation, especially in preliminary design. Our approach can be applied to arbitrarily shaped parts without pre-defined feature libraries. The focus is on the identification of geometric characteristics, e.g. heavy mass regions, that could be responsible for thermal-related part defects. A distance transform with city-block metric is used to extract this geometric property. Volume visualization techniques are also adopted to allow users to visualize the results in a clear and precise way
Keywords :
CAD/CAM; casting; computational geometry; computer integrated manufacturing; data visualisation; manufacturing processes; quality control; CAE tools; arbitrarily shaped parts; city-block metric; computer aided engineering; die casting; die geometry; diecastability visualization; distance transform; feature libraries; geometric characteristics; manufacturability; manufacturing processes; part geometry; part quality; thermal-related part defects; volume visualization; volume-based approach; volume-based reasoning; Computational geometry; Computer aided manufacturing; Data mining; Design automation; Design for manufacture; Die casting; Information geometry; Manufacturing processes; Solid modeling; Visualization;
Conference_Titel :
Visualization, 1995. Visualization '95. Proceedings., IEEE Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-8186-7187-4
DOI :
10.1109/VISUAL.1995.485152