DocumentCode :
3240451
Title :
Passing the 10-year Mark - a multi-year, multi-technology analysis of Ni-Cd field data
Author :
Lansburg, Stuart ; Brenier, Antoine ; Boulais, Rodolphe
Author_Institution :
Saft America, Inc., Valdosta, GA, USA
fYear :
2010
fDate :
6-10 June 2010
Firstpage :
1
Lastpage :
8
Abstract :
Over the last 10 years, Ni-Cd (Nickel-Cadmium) batteries were installed and operated in remote terminals as standby energy storage in various telecom applications. The uncontrolled environment, of the outside plant (OSP) cabinet, challenges battery performance, battery life and battery safety.
Keywords :
Assembly systems; Batteries; Energy storage; Europe; Life testing; Manufacturing; North America; Safety; Telecommunications; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunications Energy Conference (INTELEC), 32nd International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
978-1-4244-3383-4
Electronic_ISBN :
978-1-4244-3384-1
Type :
conf
DOI :
10.1109/INTLEC.2010.5525695
Filename :
5525695
Link To Document :
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