• DocumentCode
    3240842
  • Title

    Defect Tolerance in Homogeneous Manycore Processors Using Core-Level Redundancy with Unified Topology

  • Author

    Lei Zhang ; Yinhe Han ; Qiang Xu ; Xiaowei Li

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    891
  • Lastpage
    896
  • Abstract
    Homogeneous manycore processors are emerging for tera-scale computation. Effective defect tolerance techniques are essential to improve the yield of such complex integrated circuits. In this paper, we propose to achieve fault tolerance by employing redundancy at the core-level instead of at the microarchitecture-level. When faulty cores existing on-chip in this architecture, how to reconfigure the processor with the most effective topology is a relevant research problem. We present novel solutions for this problem, which not only maximize the performance of the manycore processor, but also provide a unified topology to operating system and application software running on the processor. Experimental results show the effectiveness of the proposed techniques.
  • Keywords
    fault tolerance; microprocessor chips; redundancy; system-on-chip; complex integrated circuit yield; core-level redundancy; defect tolerance techniques; homogeneous manycore processors; on-chip architecture; operating system unified topology; tera-scale computation; Circuit faults; Computer architecture; Manufacturing processes; Microarchitecture; Multicore processing; Network-on-a-chip; Operating systems; Programming profession; Redundancy; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484787
  • Filename
    4484787