DocumentCode :
3240897
Title :
From the Technical Chair
fYear :
2006
fDate :
18-21 Sept. 2006
Abstract :
Presents the welcome message from the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Type :
conf
DOI :
10.1109/AUTEST.2006.283656
Filename :
4062306
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3240897