Title :
Qalitative and Quantitative Analysis of IC Designs
Author :
Hausler, Stefan ; Poppen, Frank ; Hausmann, Kevin ; Hahn, Axel ; Nebel, Wolfgang
Author_Institution :
OFFIS, University of Oldenburg, Oldenburg, DE
Keywords :
Algorithm design and analysis; Electronic design automation and methodology; Integrated circuit measurements; Integrated circuit technology; Microelectronics; Mirrors; Productivity; Standards development; Table lookup; Timing;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich, Germany
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484796
