DocumentCode :
3241015
Title :
Patterns And Factor Analysis
Author :
Paulk, Hark C.
Author_Institution :
System Development Corporation
fYear :
1981
fDate :
5-8 April 1981
Firstpage :
876
Lastpage :
880
Keywords :
Curve fitting; Data analysis; Data mining; Extraterrestrial measurements; Feature extraction; Functional analysis; Information retrieval; Pattern analysis; Pattern recognition; Psychology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon '81. Conference Proceedings
Conference_Location :
Huntsville, AL, USA
Type :
conf
DOI :
10.1109/SECON.1981.673602
Filename :
673602
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3241015
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