Title :
Reliability issues in power and ground on submicron circuits
Author :
Tuan, Jeh-Fu ; Young, Tak K.
Abstract :
The reliability of the power supply network is becoming an important issue for IC designers as circuit sizes increase. The reliability problems in power networks are electromigration, voltage drop, and ground bounce. RailMill is an integrated environment that addresses the power network reliability problems. RailMill covers four important aspects in power network analysis: accurate extraction of power networks, accurate simulation of transistor circuits, accurate simulation of power networks and layout display of circuit and simulation results
Keywords :
Circuit simulation; Data mining; Databases; Displays; Electromigration; Engines; Noise reduction; Power supplies; Resistors; Voltage;
Conference_Titel :
WESCON/'95. Conference record. 'Microelectronics Communications Technology Producing Quality Products Mobile and Portable Power Emerging Technologies'
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2636-9
DOI :
10.1109/WESCON.1995.485265
