• DocumentCode
    3241303
  • Title

    Modular Interconnect Packaging for Scaleable Systems(MIPSS) for Automatic Test Equipment - IEEE-P1693

  • Author

    Stora, Michael ; Mann, Steve ; Gildea, R. James

  • Author_Institution
    IEEE l&M Soc. A/I TC-8, Boonton, NJ
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    13
  • Lastpage
    18
  • Abstract
    This standard defines the electrical and mechanical specifications of a modular interconnect packaging system design for automatic test system (ATS). It specifically describes a building block approach based upon the integration of three elements: (1) the outer enclosure and the inner Eurocard standard mechanical chassis that forms the mechanical structure of the building block with alignment features to mate with other enclosures (building blocks); (2) revised IEEE-1155 Standard for VME extensions for Instrumentation (VXI), that adds serial bus control to the backplane, a new pluggable virtual power source, and extends the VXI module length to directly couple with rear connectors of the IEEE-P1505 receiver fixture interface (RFI) standard; and (3) the segmentation of the IEEE-P1505 RFI receiver framework to match size of the basic building block while also meeting the intent of the IEEE-P1505.1 common test interface (CTI) pin map standard.
  • Keywords
    IEEE standards; automatic test equipment; modules; packaging; Common Test Interface Pin Map Standard; IEEE-1155 Standard; IEEE-P1505 Receiver Fixture Interface Standard; IEEE-P1693; IEEE-PI505 RFI Receiver Framework; VME extensions for Instrumentation; VXI module; automatic test equipment; building block approach; enclosures; inner Eurocard standard; mechanical chassis; mechanical structure; modular interconnect packaging for scaleable systems; pluggable virtual power source; Automatic test equipment; Automatic testing; Backplanes; Connectors; Fixtures; Instruments; Packaging machines; Radiofrequency interference; Size control; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283596
  • Filename
    4062325