• DocumentCode
    3241479
  • Title

    A Variation Aware High Level Synthesis Framework

  • Author

    Wang, Feng ; Sun, Guangyu ; Xie, Yuan

  • Author_Institution
    Pennsylvania State Univ., University Park, PA
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    1063
  • Lastpage
    1068
  • Abstract
    The worst-case delay/power of function units has been used in traditional high level synthesis to facilitate design space exploration. As technology scales to nanometer regime, the impact of process variations increases. The degree of variability encountered in the new process technologies makes worst-case analysis undesirable, because it may result in unexpected performance/power discrepancy or a pessimistic estimation, and may end up using excess resources to guarantee design constraints. In this paper, we propose a high level synthesis framework to take into account of the performance/power variation for function units. An effective metric called parametric yield, which is defined as the probability of the synthesized data flow graph (DFG) meeting the performance and power constraints, is used to guide scheduling, module selection, and resource sharing. An efficient performance/power yield perturbation computation method for DFG significantly improves the effectiveness of our yield driven high level synthesis algorithm. The experimental results show that our variation-aware synthesis framework achieves significant yield improvements, and has much faster (3X) runtime speed compared against previous approach.
  • Keywords
    data flow graphs; high level synthesis; integrated circuit yield; design constraints; design space exploration; function units; module selection; parametric yield; process variations; resource sharing; synthesized data flow graph; variation aware high level synthesis; Delay; Flow graphs; High level synthesis; High performance computing; Performance analysis; Processor scheduling; Resource management; Runtime; Space exploration; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484822
  • Filename
    4484822