• DocumentCode
    3241482
  • Title

    Phenomenological approach to the physical interpretation of the negative capacities in zeolites

  • Author

    Fernández-Gutiérrez, F. ; González-Perez, E. ; Berazain-Iturralde, A. ; Hernández-Vélez, M. ; Albella, J.M.

  • Author_Institution
    Inst. Ciencia de Mater., Univ. Autonoma de Madrid, Spain
  • fYear
    1995
  • fDate
    10-13 Jul 1995
  • Firstpage
    78
  • Lastpage
    82
  • Abstract
    We have studied the transient response of some capacitor systems during the charging process to a step function voltage. The dielectric materials used were MOR type zeolites showing 80% of crystalline phase, as determined by X-ray diffraction (XRD). Using the Fourier integral transform and the Kramers-Kronig relations we have obtained the real and imaginary part of the permittivity. In some of these spectra a negative capacity effect has been observed. This uncommon effect is interpreted through the “universal response law” for dielectric relaxation in solids. Based on the strong low frequency dispersion mechanism a phenomenological approach is proposed to explain these results taking into account the physical properties and structure of the zeolites
  • Keywords
    Fourier transforms; Kramers-Kronig relations; X-ray diffraction; capacitance; ceramic capacitors; dielectric relaxation; permittivity; sodium compounds; transient response; Fourier integral transform; Kramers-Kronig relations; MOR type zeolites; Na8Al8Si46O96; X-ray diffraction; XRD; capacitor systems; charging process; crystalline phase; dielectric relaxation; imaginary part; negative capacities; negative capacity effect; permittivity; phenomenological approach; real part; step function voltage; strong low frequency dispersion mechanism; transient response; universal response law; zeolites; Capacitors; Crystallization; Dielectric materials; Fourier transforms; Permittivity; Transient response; Voltage; X-ray diffraction; X-ray imaging; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
  • Conference_Location
    Leicester
  • Print_ISBN
    0-7803-2040-9
  • Type

    conf

  • DOI
    10.1109/ICSD.1995.522953
  • Filename
    522953