DocumentCode
3241482
Title
Phenomenological approach to the physical interpretation of the negative capacities in zeolites
Author
Fernández-Gutiérrez, F. ; González-Perez, E. ; Berazain-Iturralde, A. ; Hernández-Vélez, M. ; Albella, J.M.
Author_Institution
Inst. Ciencia de Mater., Univ. Autonoma de Madrid, Spain
fYear
1995
fDate
10-13 Jul 1995
Firstpage
78
Lastpage
82
Abstract
We have studied the transient response of some capacitor systems during the charging process to a step function voltage. The dielectric materials used were MOR type zeolites showing 80% of crystalline phase, as determined by X-ray diffraction (XRD). Using the Fourier integral transform and the Kramers-Kronig relations we have obtained the real and imaginary part of the permittivity. In some of these spectra a negative capacity effect has been observed. This uncommon effect is interpreted through the “universal response law” for dielectric relaxation in solids. Based on the strong low frequency dispersion mechanism a phenomenological approach is proposed to explain these results taking into account the physical properties and structure of the zeolites
Keywords
Fourier transforms; Kramers-Kronig relations; X-ray diffraction; capacitance; ceramic capacitors; dielectric relaxation; permittivity; sodium compounds; transient response; Fourier integral transform; Kramers-Kronig relations; MOR type zeolites; Na8Al8Si46O96; X-ray diffraction; XRD; capacitor systems; charging process; crystalline phase; dielectric relaxation; imaginary part; negative capacities; negative capacity effect; permittivity; phenomenological approach; real part; step function voltage; strong low frequency dispersion mechanism; transient response; universal response law; zeolites; Capacitors; Crystallization; Dielectric materials; Fourier transforms; Permittivity; Transient response; Voltage; X-ray diffraction; X-ray imaging; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location
Leicester
Print_ISBN
0-7803-2040-9
Type
conf
DOI
10.1109/ICSD.1995.522953
Filename
522953
Link To Document