DocumentCode
3241612
Title
Cost Effective Test Planning for System-on-Chip Manufacture
Author
Lee, Songjun ; Ambler, Anthony P.
Author_Institution
Electr. Eng. & Comput. Sci., Hanyang Univ., Ansan
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
86
Lastpage
92
Abstract
The test of chip has become an important issue as its complexity has been dramatically increased. Currently, system-on-chip (SoC) is major product that can be used for many applications. Since the SoC is a chip designed by VLSI design techniques, its methodologies of design and test are similar to conventional chip manufacturing aspects. However, the complexity, developing procedures, and many other things are different from the case of the conventional chips. Thus, new test approach is needed for complex SoC. The proposed economics model for SoC helps the chip developers predict total cost of SoC development at the early design stage, and decide the strategy to test by cost- effective way.
Keywords
VLSI; integrated circuit design; integrated circuit manufacture; integrated circuit testing; system-on-chip; VLSI design; chip manufacturing; cost effective test planning; system-on-chip manufacture; Circuit testing; Costs; Design methodology; Economic forecasting; Predictive models; Semiconductor device manufacture; System testing; System-on-a-chip; Very large scale integration; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283605
Filename
4062340
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