• DocumentCode
    3241612
  • Title

    Cost Effective Test Planning for System-on-Chip Manufacture

  • Author

    Lee, Songjun ; Ambler, Anthony P.

  • Author_Institution
    Electr. Eng. & Comput. Sci., Hanyang Univ., Ansan
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    86
  • Lastpage
    92
  • Abstract
    The test of chip has become an important issue as its complexity has been dramatically increased. Currently, system-on-chip (SoC) is major product that can be used for many applications. Since the SoC is a chip designed by VLSI design techniques, its methodologies of design and test are similar to conventional chip manufacturing aspects. However, the complexity, developing procedures, and many other things are different from the case of the conventional chips. Thus, new test approach is needed for complex SoC. The proposed economics model for SoC helps the chip developers predict total cost of SoC development at the early design stage, and decide the strategy to test by cost- effective way.
  • Keywords
    VLSI; integrated circuit design; integrated circuit manufacture; integrated circuit testing; system-on-chip; VLSI design; chip manufacturing; cost effective test planning; system-on-chip manufacture; Circuit testing; Costs; Design methodology; Economic forecasting; Predictive models; Semiconductor device manufacture; System testing; System-on-a-chip; Very large scale integration; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283605
  • Filename
    4062340