Title :
Transparent Reconfigurable Acceleration for Heterogeneous Embedded Applications
Author :
Beck, Antonio Carlos S ; Rutzig, Mateus B. ; Gaydadjiev, Georgi ; Carro, Luigi
Author_Institution :
Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
Embedded systems are becoming increasingly complex. Besides the additional processing capabilities, they are characterized by high diversity of computational models coexisting in a single device. Although reconfigurable architectures have already shown to be a potential solution for such systems, they just present significant speedups of very specific dataflow oriented kernels. Furthermore, reconfigurable fabric is still withheld by the need of special tools and compilers, clearly not sustaining backward software compatibility. In this paper, we propose a new technique to optimize both dataflow and control-flow oriented code in a totally transparent process, without the need of any modification in the source or binary codes. For that, we have developed a Binary Translation algorithm implemented in hardware, which works in parallel to a MIPS processor. The proposed mechanism is responsible for transforming sequences of instructions at runtime to be executed on a dynamic coarse-grain reconfigurable array, supporting speculative execution. Executing the MIBench suite, we show performance improvements of up to 2.5 times, while reducing 1.7 times the required energy, using trivial hardware resources.
Keywords :
embedded systems; logic design; microprocessor chips; reconfigurable architectures; MIBench suite; MIPS processor; binary codes; binary translation algorithm; control-flow oriented code; dataflow oriented kernels; dynamic coarse-grain reconfigurable array; embedded systems; heterogeneous embedded applications; reconfigurable architectures; speculative execution; transparent reconfigurable acceleration; Acceleration; Binary codes; Computational modeling; Embedded system; Fabrics; Hardware; Kernel; Reconfigurable architectures; Runtime; Software tools;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484843