• DocumentCode
    3241851
  • Title

    LXI Clears the Way to Smarter Instruments

  • Author

    Franklin, Pau F.

  • Author_Institution
    Keithley Instrum. Inc., Cleveland, OH
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    136
  • Lastpage
    140
  • Abstract
    The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN extensions for instrumentation) standard enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use.
  • Keywords
    data analysis; local area networks; peripheral interfaces; LAN extensions; LXI; advanced data analysis; intelligent instruments; measurement equipment; Acceleration; Costs; Data analysis; Instruments; Local area networks; Maintenance; Manufacturing; Power measurement; System testing; Web pages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283610
  • Filename
    4062351