DocumentCode
3241851
Title
LXI Clears the Way to Smarter Instruments
Author
Franklin, Pau F.
Author_Institution
Keithley Instrum. Inc., Cleveland, OH
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
136
Lastpage
140
Abstract
The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN extensions for instrumentation) standard enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use.
Keywords
data analysis; local area networks; peripheral interfaces; LAN extensions; LXI; advanced data analysis; intelligent instruments; measurement equipment; Acceleration; Costs; Data analysis; Instruments; Local area networks; Maintenance; Manufacturing; Power measurement; System testing; Web pages;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283610
Filename
4062351
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