Title :
A Method for Reflectometry Attribute Modeling Based on Linear Light Source
Author :
Liu, Ruijun ; Qi, Yue ; Hu, Yong ; Shen, Xukun
Author_Institution :
State Key Lab. of Virtual Reality Technol. & Syst., Beijing
Abstract :
The modeling and rendering of real material properties highly rely on precise data acquisition. However, it is fairly hard to gather and model the bidirectional reflectance distribution function (BRDF), which indicates the properties of real material properties. This report presents the gathering data by BRDF on the basis of linear-light source reflector. By optimizing the table of linear-light source reflector, it can more precisely recover the correlation parameter of Ward model in order to be beneficial for real material properties modeling, and construct the spatial varying BRDF (SVBRDF). The results of experiment demonstrate that BRDF data gathering method is simple, highly active, as well as keeps results accurate and precise.
Keywords :
data acquisition; light sources; physics computing; reflectometry; Ward model; bidirectional reflectance distribution function; correlation parameter; data acquisition; linear-light source reflector; reflectometry attribute modeling; spatial varying BRDF; Bidirectional control; Brain modeling; Data acquisition; Distribution functions; Laboratories; Light sources; Material properties; Reflectivity; Reflectometry; Virtual reality;
Conference_Titel :
Pattern Recognition, 2008. CCPR '08. Chinese Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2316-3
DOI :
10.1109/CCPR.2008.28
