A Method for Reflectometry Attribute Modeling Based on Linear Light Source

Author

Liu, Ruijun ; Qi, Yue ; Hu, Yong ; Shen, Xukun

Author_Institution

State Key Lab. of Virtual Reality Technol. & Syst., Beijing

fYear

2008

fDate

22-24 Oct. 2008

Firstpage

1

Lastpage

6

Abstract

The modeling and rendering of real material properties highly rely on precise data acquisition. However, it is fairly hard to gather and model the bidirectional reflectance distribution function (BRDF), which indicates the properties of real material properties. This report presents the gathering data by BRDF on the basis of linear-light source reflector. By optimizing the table of linear-light source reflector, it can more precisely recover the correlation parameter of Ward model in order to be beneficial for real material properties modeling, and construct the spatial varying BRDF (SVBRDF). The results of experiment demonstrate that BRDF data gathering method is simple, highly active, as well as keeps results accurate and precise.

Keywords

data acquisition; light sources; physics computing; reflectometry; Ward model; bidirectional reflectance distribution function; correlation parameter; data acquisition; linear-light source reflector; reflectometry attribute modeling; spatial varying BRDF; Bidirectional control; Brain modeling; Data acquisition; Distribution functions; Laboratories; Light sources; Material properties; Reflectivity; Reflectometry; Virtual reality;

fLanguage

English

Publisher

ieee

Conference_Titel

Pattern Recognition, 2008. CCPR '08. Chinese Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-2316-3

Type

conf

DOI

10.1109/CCPR.2008.28

Filename

4662981