DocumentCode :
3241958
Title :
An Open-Loop Flow Control Scheme Based on the Accurate Global Information of On-Chip Communication
Author :
Kwon, Woo-Cheol ; Hong, Sung-Min ; Yoo, Sungjoo ; Min, Byeong ; Choi, Kyu-Myung ; Eo, Soo-Kwan
Author_Institution :
Syst. LSI Div., Samsung Electron., Suwon
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
1244
Lastpage :
1249
Abstract :
3D stacked memory is being adopted as a promising solution to offer high bandwidth and low latency in memory access. Compared with the on-chip network design with conventional off chip memory, it gives a new problem of minimizing communication conflicts since multiple concurrent high bandwidth data transfers will flow through the on-chip network. In order to tackle this problem, we propose applying an open-loop flow control scheme based on the accurate global information (destination and status) of on-chip communication. The proposed open-loop flow control scheme exploits the information and selectively buffers and arbitrates data transfers to remove conflicts at destinations in a preventive manner. As an implementation of the presented scheme, we present on-chip buffers called Buf3D´s that share the global information with each other to perform the selective buffering and arbitration of data transfers. Experiments with synthetic test cases and an industrial strength DTV design show that the proposed method improves aggregate memory bandwidth significantly (average 19.0 %~25.8 % in the synthetic cases and up to 18.4 % in the DTV case) with a small area overhead (15.2 % in the DTV case) of on-chip network.
Keywords :
buffer storage; open loop systems; 3D stacked memory; industrial strength DTV design; memory access; multiple concurrent high bandwidth data transfers; onchip communication; onchip network design; open-loop flow control scheme; Bandwidth; Communication networks; Communication system control; Control systems; Delay; Digital TV; Feedback loop; Network-on-a-chip; Open loop systems; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484849
Filename :
4484849
Link To Document :
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