• DocumentCode
    3242160
  • Title

    Electronics Prognostics--"Driving Just-In-Time Maintenance"

  • Author

    Hernandez, Luis ; Gebraeel, Nagi Z.

  • Author_Institution
    Global Strategic Solutions LLC, Herndon, VA
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    187
  • Lastpage
    194
  • Abstract
    Electronic equipment prognostics (EPS) and health management is a critical technology for accurately predicting impending failures and providing a decision process and a mechanism for replacing components safely before actual failures occur. Equipment diagnostics, on the other hand, involve the process of determining by examination (operator, visual, test data) the nature and circumstances of the "failure condition" in the equipment, after the fact. In modern electronic systems, the systems themselves have internal health monitoring mechanisms which can provide early diagnostic indications (data) of the impending failures so that a "prognosis" of the equipment can be made with a reasonable level of confidence. It is this ability to leverage the diagnostic data from the equipment\´s own internal health monitoring mechanisms and predict impending failures that we call "Just-in-time Maintenance". This paper outlines a vision for an EPS design framework and discusses the synergy and benefits of using Just-in-time Maintenance.
  • Keywords
    electronic equipment testing; failure analysis; maintenance engineering; military equipment; EPS design framework; decision process; diagnostic data; diagnostic indications; electronic equipment prognostics; equipment diagnostics; failure condition; health management; impending failures; internal health monitoring mechanisms; just-in-time maintenance; modern electronic systems; Asset management; Condition monitoring; Consumer electronics; Cost function; Defense industry; Electronic equipment; Electronic equipment testing; Predictive models; Productivity; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283624
  • Filename
    4062365