• DocumentCode
    3242230
  • Title

    Vibration control of a novel tube scanner using piezoelectric strain-induced voltage

  • Author

    Yong, Yuen Kuan ; Moheimani, S. O. Reza

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Newcastle, NSW, Australia
  • fYear
    2009
  • fDate
    14-17 July 2009
  • Firstpage
    1070
  • Lastpage
    1075
  • Abstract
    Piezoelectric tube scanners are widely used in nanopositioning applications such as in scanning probe microscopy. Capacitive or inductive sensors are used to provide feedback to improve bandwidth and accuracy of these tube scanners. However, these sensors contain certain noise densities which restrict the bandwidth of the closed loop system if nanometer resolution is required. The use of piezoelectric strain-induced voltage as a measurement signal has been recently proposed to provide feedback with a noise profile of up to three orders of magnitude better than capacitive sensors. This technique uses a quadrant of the electrode for actuation and the opposite quadrant for sensing. The major drawbacks of this arrangement are that the travel range of the tube is reduced by half and the tube is not driven symmetrically; thus the tube is not a collocated system. In this article, a novel electrode pattern of a tube scanner which addresses the above issues and allows for simultaneous actuation and sensing is presented. By using the piezoelectric strain voltage as measurement, an Integral Resonant Control (IRC) method combined with a feedforward inversion technique is implemented to achieve high-speed and accurate scanning performances of the tube.
  • Keywords
    closed loop systems; feedback; nanopositioning; scanning probe microscopy; vibration control; Integral Resonant Control method; closed loop system; feedback; nanopositioning applications; novel tube scanner; piezoelectric strain-induced voltage; scanning probe microscopy; vibration control; Bandwidth; Capacitive sensors; Electrodes; Feedback; Nanopositioning; Scanning probe microscopy; Sensor systems; Strain measurement; Vibration control; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics, 2009. AIM 2009. IEEE/ASME International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2852-6
  • Type

    conf

  • DOI
    10.1109/AIM.2009.5229728
  • Filename
    5229728