Title :
Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems
Author :
Suri, Neeraj ; Fetzer, Christof ; Abraham, Jacob ; Poledna, Stefan ; Mendelson, Avi ; Mitra, Subhasish
Author_Institution :
TU Darmstadt, Germany
Abstract :
The paper presents a panel discussion on the issues and challenges in dependable embedded system from both the academic and industrial perspectives. The panelists are Jacob Abraham from the University of Texas at Austin-USA, Stefan Poledna from TTTech-Austria, Avi Mendelson from Intel-Israel, and Subhasish Mitra from Stanford University-USA.
Keywords :
embedded systems; logic design; reliability; academic perspective; dependable embedded systems; industrial perspective; panel discussion; Circuit testing; Embedded system; Fault tolerance; Hardware; Integrated circuit technology; Integrated circuit testing; Jacobian matrices; Paper technology; Robustness; System testing;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484868
