Title :
On the simulation of Multiple Stuck-at Faults using Multiple Domain Concurrent and Comparative Simulation
Author :
Lentz, Karen P. ; Manolakos, Elias S. ; Czeck, Edward C.
Author_Institution :
Tufts Univ., Medford, MA, USA
Abstract :
This paper presents an advanced concurrent simulation technique for performing Multiple Stuck-at Fault Simulation based on Multiple Domain Concurrent and Comparative Simulation (MDCCS). It efficiently compresses multiple experiments in a single simulation and requires no pre-analysis of the circuit. In addition, MDCCS has a unique feature that allows experiments to interact with each other and spawn offspring experiments should new behaviors arise. MDCCS is based on discrete event concurrent simulation (CS) and gains efficiency by utilizing the similarity among experiments without resorting to parallel hardware. It provides a mechanism for managing the complexity of interactions such that the implementation of this methodology is both storage and CPU time efficient. The intention of this paper is to present the MDCCS framework and report on its effectiveness for digital logic fault simulation
Keywords :
circuit analysis computing; concurrent engineering; discrete event simulation; fault diagnosis; fault location; logic testing; CPU time efficiency; MDCCS; comparative simulation; digital logic fault simulation; discrete event concurrent simulation; multiple domain simulation; multiple stuck-at fault simulation; Aggregates; Carbon capture and storage; Circuit faults; Circuit simulation; Discrete event simulation; Logic testing; Presses;
Conference_Titel :
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7129-7
DOI :
10.1109/ATS.1995.485321
