Title :
On the fault-tolerant pancyclicity of crossed cubes
Author :
Huang, Wen-Tzeng ; Chen, Woei-Kae ; Chen, Chin-Hsing
Author_Institution :
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taiwan
Abstract :
A graph is pancyclic if it contains all cycles from lengths 4 to |V(G)|. An n-dimensional crossed cube, an important variation of hypercube denoted as CQn, has been proved to be pancyclic because it contains all cycles whose lengths range from 4 to |V(CQn)|. Since vertex and edge faults may occur when a network is used, it is practical and meaningful to evaluate the performance of a faulty network. Moreover the vertex fault-tolerant Hamiltonicity and the edge fault-tolerant Hamiltonicity measure the performances of the Hamiltonian properties in the faulty networks. From this fault-tolerant concept, we propose using the fault-tolerant pancyclicity of networks to measure the performance of faulty networks. In this paper we consider a faulty crossed n-cube with vertex and/or edge faults here. Let the faulty set F be a subset of V(CQn)∪E(CQn). We prove that any cycle of length l(4≤l≤|V(CQn)|-fν) can be embedded into a faulty crossed n-cube CQn-F with dilation 1, where |F|=fν+fe is less than n-2, fν is the number of faulty vertices of F, fe is the number of faulty edges of F, and n is greater than 2. The results can readily be used in the optimum embedding of a ring of the specified length in a faulty crossed cube.
Keywords :
fault tolerant computing; hypercube networks; cycle; edge faults; fault-tolerant Hamiltonicity; fault-tolerant pancyclicity; faulty network; hypercube; n-dimensional crossed cube; optimum ring embedding; vertex fault-tolerant Hamiltonicity; vertex faults; Algorithm design and analysis; Computer networks; Contracts; Councils; Fault tolerance; Hypercubes; Information science; Management information systems; Multiprocessor interconnection networks; Performance evaluation;
Conference_Titel :
Parallel and Distributed Systems, 2002. Proceedings. Ninth International Conference on
Print_ISBN :
0-7695-1760-9
DOI :
10.1109/ICPADS.2002.1183445