• DocumentCode
    3242455
  • Title

    Dielectric studies of solder paste fluxes and applications to no-clean paste formulations

  • Author

    Raleigh, C. ; Prack, E.

  • Author_Institution
    Motorola Inc., Schaumburg, IL, USA
  • fYear
    1989
  • fDate
    25-27 Sep 1989
  • Firstpage
    307
  • Lastpage
    309
  • Abstract
    Ionic mobility is monitored using a 12.5-μm interdigitated electrode to monitor conductivity, loss factor, and permittivity of solder flux, solder vehicle, and solder residue. Maximum ionic mobility is achieved at the temperature for minimum viscosity (87°C) and other increases can be seen at the melting point of abietic acid. Ionic mobility is shown to be dependent on the amount of plasticizer in the resin material which is correlated to the material´s glass transition and viscosity. Differences in the particle size of metal particles in neat solder pastes have been correlated to the permittivity in this system. Measurements were made using a ceramic sensor with a 10-mil interdigitated electrode pattern. A linear relationship between particle size/relative surface area of the metal particles and permittivity has been observed. Flocculation has been observed by this method in pastes containing small particle size metal particles
  • Keywords
    hybrid integrated circuits; ionic conduction in solids; soldering; surface mount technology; 10 mil; 12.5 micron; 87 C; amount of plasticizer; ceramic sensor; conductivity; flocculation; glass transition; interdigitated electrode; ionic mobility; loss factor; melting point of abietic acid; neat solder pastes; no-clean paste formulations; particle size of metal particles; permittivity; reflow soldering; solder flux; solder paste fluxes; solder residue; solder vehicle; surface area; temperature for minimum viscosity; Conductivity; Dielectrics; Electrodes; Glass; Monitoring; Permittivity; Resins; Temperature; Vehicles; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Seventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1109/EMTS.1989.68994
  • Filename
    68994