DocumentCode
3242496
Title
A new method for testing mixed analog and digital circuits
Author
Rzeszut, Janusz ; Kaminska, Bozena ; Savaria, Yvon
Author_Institution
Ecole Polytech. de Montreal, Que., Canada
fYear
1995
fDate
23-24 Nov 1995
Firstpage
127
Lastpage
132
Abstract
In this paper a new method is proposed for observing analog test points inside integrated circuits that enables the simultaneous observation of a large number of points. The method permits the removal of the analog multiplexer from the signal path and a reduction of the load introduced at the observed test points. A charge coupled device analog shift register is used to sample input voltage and shift out a charge that is proportional to the input voltage
Keywords
analogue processing circuits; charge-coupled device circuits; integrated circuit testing; mixed analogue-digital integrated circuits; shift registers; analog multiplexer; analog shift register; analog test points; charge coupled device; input voltage; mixed analog and digital circuits; signal path; simultaneous observation; Circuit faults; Circuit testing; Digital circuits; Integrated circuit testing; Multiplexing; Open loop systems; Operational amplifiers; Registers; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location
Bangalore
Print_ISBN
0-8186-7129-7
Type
conf
DOI
10.1109/ATS.1995.485327
Filename
485327
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