Title :
Stability diagnosis of microwave recursive structures using the NDF methodology
Author :
Billonnet, L. ; Jarry, B. ; Guillon, Pierre
Author_Institution :
IRCOM, Limoges Univ., France
Abstract :
In this paper, we verify and validate the new important concepts developed by W. Struble and A. Platzkerin (see IEEE GaAs IC Symp. Dig., p. 251-4, 1993) by comparing the NDF method to-classical-low frequency concepts which, under some assumptions, can be applied to microwave recursive structures. We proceed with the examples of a first-order and a second-order recursive filters and show how the NDF expression for this kind of filter can be easily identified.<>
Keywords :
active filters; circuit stability; filtering theory; microwave filters; recursive filters; NDF methodology; microwave recursive structures; recursive filters; stability diagnosis; Active filters; Delay effects; Frequency; Microwave filters; Microwave theory and techniques; Nonlinear filters; Stability analysis; Topology; Transfer functions; Transversal filters;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406238
