Title :
Test Application Program Interface for Instrumentation
Author_Institution :
NSWC Corona Div., Corona, CA
Abstract :
Instruments have become complex and so has the driver software for using them. This paper discusses a high-level application program interface (API) that handles the complexity instead of the test application. The API is normally written in the same language the test application uses. The API can be reused when testing similar devices. All calls made to the instrument drivers are located in the API and not in the main application to isolate them from the hardware. The API can use all driver types; interchangeable virtual instruments (IVI), Plug and Play (PnP) or custom as long as the native language supports it. The API can improve performance through various techniques such as state caching or parallel processing. Common setups and measurements are put in the API to avoid duplication of code. The API includes automatic switching by specifying the instrument and test point using symbolic names having the software safely determine the correct path. Using an API simplifies test procedures, makes system upgrades easier, enhances performance and automatically handles all instrumentation errors.
Keywords :
application program interfaces; automatic test equipment; virtual instrumentation; automatic switching; driver software; high-level application program interface; instrument drivers; instrumentation errors; interchangeable virtual instruments; parallel processing; plug and play; state caching; test application program interface; Application software; Automatic testing; Computer languages; Corona; Hardware; Instruments; Parallel processing; Software libraries; Software testing; System testing;
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2006.283668