Title :
Comments on the interpretation of temperature dependence of processes in dielectrics
Author :
Tudos, F. ; David, P.K.
Author_Institution :
Central Res. Inst. for Chem., Hungarian Acad. of Sci., Budapest, Hungary
Abstract :
We have shown that the parameters of two equations (Arrhenius and Eyring) are mathematically convertible to each other by the use of universal material constants and the average temperature of the process. Thus the conceptual quantities “entropy of activation” and “enthalpy of activation” in the Eyring equation (stemming from the unjustified assumption of equilibrium for the activated state of reactions) give no more or no newer physical information than the Arrhenius parameters
Keywords :
chemical equilibrium; dielectric relaxation; enthalpy; entropy; heat of reaction; Arrhenius equation; Arrhenius parameters; Eyring equation; activation enthalpy; activation entropy; average temperature; dielectric relaxation; dielectrics; equilibrium; temperature dependence; universal material constants; Chemical processes; Chemical technology; Chemistry; Dielectrics; Differential equations; Entropy; Kinetic theory; Material properties; Temperature dependence; Thermodynamics;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
DOI :
10.1109/ICSD.1995.522975
