DocumentCode
3242682
Title
A Next Generation Test Framework for Automated Storage System Readiness Validation
Author
Hagerott, Steven G. ; Balasubramanian, Sridhar
Author_Institution
Engenio Storage Group, LSI Logic Corp., Wichita, KS
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
300
Lastpage
305
Abstract
A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated manipulation of storage system components in a controlled test environment enables long- term application of maintenance and fault profiles to validate high availability of the storage system to the network. This test framework can be readily extended at low cost to other electromechanical components to validate their system readiness. The salient attributes of the framework´s architecture, deployed components, and application programming interface (API) are presented. A concluding case study is provided to illustrate the successful application of this test automation framework to enterprise class RAID storage system testing.
Keywords
RAID; application program interfaces; application programming interface; automated storage system readiness validation; electrical-mechanical manipulation; electromechanical components; enterprise class RAID storage system testing; next generation test framework; test automation; Automatic testing; Availability; Costs; Hardware; Large scale integration; Logic testing; Maintenance; Next generation networking; Storage automation; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283674
Filename
4062387
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