DocumentCode :
3242682
Title :
A Next Generation Test Framework for Automated Storage System Readiness Validation
Author :
Hagerott, Steven G. ; Balasubramanian, Sridhar
Author_Institution :
Engenio Storage Group, LSI Logic Corp., Wichita, KS
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
300
Lastpage :
305
Abstract :
A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated manipulation of storage system components in a controlled test environment enables long- term application of maintenance and fault profiles to validate high availability of the storage system to the network. This test framework can be readily extended at low cost to other electromechanical components to validate their system readiness. The salient attributes of the framework´s architecture, deployed components, and application programming interface (API) are presented. A concluding case study is provided to illustrate the successful application of this test automation framework to enterprise class RAID storage system testing.
Keywords :
RAID; application program interfaces; application programming interface; automated storage system readiness validation; electrical-mechanical manipulation; electromechanical components; enterprise class RAID storage system testing; next generation test framework; test automation; Automatic testing; Availability; Costs; Hardware; Large scale integration; Logic testing; Maintenance; Next generation networking; Storage automation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283674
Filename :
4062387
Link To Document :
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