DocumentCode :
3242700
Title :
Training diploma students on ATE-related module
Author :
Wang, Hou Sheng
fYear :
1995
fDate :
23-24 Nov 1995
Firstpage :
184
Lastpage :
187
Abstract :
This paper presents the approach adopted by a tertiary institution in teaching ATE-related module to final year students. The Automated Test Systems module is one of the three core subjects taught in the Microelectronics option of a Diploma offered by the Electronics and Communication Engineering (EC) Department of the Singapore Polytechnic. The module aims, teaching methods and means of assessment were developed based on the Singapore Polytechnic Education Model [1]. Due to the rapid development of technology used in automated test equipment, there was a need to develop further material for continuing education. A brief description of a module taken in the Advanced Diploma in Microelectronics, illustrates the various aspects of generating test patterns for printed circuit boards. The importance placed on practical training can be seen from the two industry-standard automatic test systems used in the laboratory session
Keywords :
automatic test equipment; automatic testing; educational courses; electronic engineering education; electronic equipment testing; integrated circuit testing; printed circuit testing; teaching; training; ATE-related module; Advanced Diploma; Electronics and Communication Engineering Department; Microelectronics option; Singapore Polytechnic; Singapore Polytechnic Education Model; assessment; automated test equipment; diploma students; final year students; industry-standard; laboratory session; practical training; printed circuit boards; teaching; tertiary institution; test patterns; Automatic testing; Circuit testing; Continuing education; Educational technology; Electronic equipment testing; Industrial training; Microelectronics; System testing; Test equipment; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7129-7
Type :
conf
DOI :
10.1109/ATS.1995.485335
Filename :
485335
Link To Document :
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