DocumentCode :
3242796
Title :
Integrating a Graphical Instrument Development Environment with an Existing Applications Development Environment and Test Executive
Author :
Eracar, Yonet A.
Author_Institution :
Teradyne, North Reading, MA
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
323
Lastpage :
328
Abstract :
This paper describes a graphical instrument-specific test development environment that generates standard-language test code or a test data file that can be used by virtually any applications development environment (ADE). Examples demonstrate where code is appropriate, where pure data is appropriate, and how each is used by the various available commercial ADE and test executive environments.
Keywords :
automatic test equipment; computerised instrumentation; development systems; applications development environment; graphical instrument-specific test development; standard-language test code; test data file; test executive; Automatic testing; Collaborative work; Costs; Data engineering; Instruments; Production facilities; Space technology; System testing; Throughput; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283679
Filename :
4062392
Link To Document :
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