Title :
A programmable multiple-sequence generator for BIST applications
Author :
Sheu, Meng Lieh ; Lee, Chung Len
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this paper, a programmable multiple-sequence generation scheme, which is constructed from a two-dimension-like feedback shift register structure, to generate a set of deterministic sequence of vectors followed by pseudo-random vectors is presented. A sequence segmentation method is employed to handle a long sequence of vectors. The proposed scheme has a regular structure, and the sequences so generated are more efficient in detecting faults for sequential circuit testing, stuck-open fault testing and delay fault testing. Hence, it is very suitable for the BIST application for MCM testing
Keywords :
binary sequences; built-in self test; delays; logic testing; sequential circuits; shift registers; BIST applications; MCM testing; delay fault testing; deterministic sequence; programmable multiple-sequence generator; pseudo-random vectors; regular structure; sequence segmentation method; sequential circuit testing; stuck-open fault testing; two-dimension-like feedback shift register; Built-in self-test; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Feedback; Sequential analysis; Sequential circuits; Shift registers;
Conference_Titel :
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7129-7
DOI :
10.1109/ATS.1995.485348
