Title :
Converting Legacy TPSs using Test Description Markup Language3826
Author :
Woodward, Vernon L. ; Martin, Lockheed S.
Keywords :
Markup languages; Publishing; Sociotechnical systems; Testing;
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2006.283690
