• DocumentCode
    3243059
  • Title

    An Automatic Design Technique for Hardware System of ATS

  • Author

    Sun, Baojiang ; Qin, Honglei ; Shen, Shituan

  • Author_Institution
    Beijing Univ. of Aeronaut. & Astronaut., Beijing
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    386
  • Lastpage
    396
  • Abstract
    The hardware development of automatic test system (ATS) is the design foundation of system. Traditionally, hardware design is a manual effort, and then based on it, the ATS software is developed. The disadvantages of manual design are obvious: heavy workload, depending on the experience of developers, limiting the quality, efficiency and standardization of hardware design, and being difficult in design data updating. As a result, the performance of the whole test system is affected. Focusing research on ATS design flows, this paper presents an automatic design technique for hardware system of ATS. During the design process, the only need is to input test points information of unit under test (UUT) and test requirements based on UUT model, and then the development platform will use several new design techniques such as automatic matching between instrument ports and UUT test points, general purpose ports design, automatic switch network generation, ITA auto-routing, and ATS self-test adapter design and so on to finish automatically a series of ATS hardware design works, which are hardware configuration, ITA design, system self-test adapter design, and fabrication drawing generation of ITA, self-test adapter and cables, etc. Developer can also choose the design solution that best fits the need from alternatives provided by development platform. This technique can significantly decrease design to factory implementation time and cost, and increase the degree of standardization and generalization of ATS.
  • Keywords
    automatic test equipment; electronic design automation; automatic design technique; automatic matching; automatic test system; hardware development; hardware system; self-test adapter design; unit under test; Automatic testing; Built-in self-test; Cables; Fabrication; Hardware; Instruments; Process design; Standardization; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283693
  • Filename
    4062406