• DocumentCode
    3243066
  • Title

    Fast computation of C-MISR signatures

  • Author

    Franklin, Manoj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
  • fYear
    1995
  • fDate
    23-24 Nov 1995
  • Firstpage
    293
  • Lastpage
    297
  • Abstract
    Cellular automata based signature analyzers are becoming very popular for compressing test responses in built-in self-test applications. Off-line determination of signatures (both good circuit signature and faulty circuit signatures) is a compute-intensive process that involves cycle-by-cycle simulation of the signature analyzer. In this paper, we investigate a technique for speeding up the simulation of cellular automata-based multi-input signature registers (C-MISRs). First, we describe a technique for converting a C-MISR into an equivalent single input circuit. We then present an algorithm for parallelizing the simulation of these single input circuits
  • Keywords
    VLSI; built-in self test; cellular automata; equivalent circuits; integrated circuit testing; logic testing; sequential circuits; shift registers; C-MISR signatures; built-in self-test applications; cellular automata-based multi-input signature registers; equivalent single input circuit; faulty circuit signatures; good circuit signature; signature analyzers; test responses; Analytical models; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Integrated circuit interconnections; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1995., Proceedings of the Fourth Asian
  • Conference_Location
    Bangalore
  • Print_ISBN
    0-8186-7129-7
  • Type

    conf

  • DOI
    10.1109/ATS.1995.485350
  • Filename
    485350