DocumentCode
3243066
Title
Fast computation of C-MISR signatures
Author
Franklin, Manoj
Author_Institution
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
fYear
1995
fDate
23-24 Nov 1995
Firstpage
293
Lastpage
297
Abstract
Cellular automata based signature analyzers are becoming very popular for compressing test responses in built-in self-test applications. Off-line determination of signatures (both good circuit signature and faulty circuit signatures) is a compute-intensive process that involves cycle-by-cycle simulation of the signature analyzer. In this paper, we investigate a technique for speeding up the simulation of cellular automata-based multi-input signature registers (C-MISRs). First, we describe a technique for converting a C-MISR into an equivalent single input circuit. We then present an algorithm for parallelizing the simulation of these single input circuits
Keywords
VLSI; built-in self test; cellular automata; equivalent circuits; integrated circuit testing; logic testing; sequential circuits; shift registers; C-MISR signatures; built-in self-test applications; cellular automata-based multi-input signature registers; equivalent single input circuit; faulty circuit signatures; good circuit signature; signature analyzers; test responses; Analytical models; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Integrated circuit interconnections; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location
Bangalore
Print_ISBN
0-8186-7129-7
Type
conf
DOI
10.1109/ATS.1995.485350
Filename
485350
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