Title :
Fast computation of C-MISR signatures
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Abstract :
Cellular automata based signature analyzers are becoming very popular for compressing test responses in built-in self-test applications. Off-line determination of signatures (both good circuit signature and faulty circuit signatures) is a compute-intensive process that involves cycle-by-cycle simulation of the signature analyzer. In this paper, we investigate a technique for speeding up the simulation of cellular automata-based multi-input signature registers (C-MISRs). First, we describe a technique for converting a C-MISR into an equivalent single input circuit. We then present an algorithm for parallelizing the simulation of these single input circuits
Keywords :
VLSI; built-in self test; cellular automata; equivalent circuits; integrated circuit testing; logic testing; sequential circuits; shift registers; C-MISR signatures; built-in self-test applications; cellular automata-based multi-input signature registers; equivalent single input circuit; faulty circuit signatures; good circuit signature; signature analyzers; test responses; Analytical models; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Integrated circuit interconnections; Registers;
Conference_Titel :
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7129-7
DOI :
10.1109/ATS.1995.485350
