DocumentCode :
3243111
Title :
Error masking in compact testing based on the Hamming code and its modifications
Author :
Demidenko, Serge ; Ivanyukovich, Alexander ; Makhist, Leonid ; Piuri, Vincenzo
Author_Institution :
Singapore Polytech., Singapore
fYear :
1995
fDate :
23-24 Nov 1995
Firstpage :
303
Lastpage :
307
Abstract :
Probability that an invalid sequence at an output of a device under test is not detected (error masking) is the measure of the effectiveness of compact testing methods. This paper evaluates and analyses the probability distribution of error masking for compact testing by exploiting the characteristics both of the Hamming code (i.e., the signature analysis) and of some modified Hamming codes. To study the effectiveness of these methods we derive also the analytical expressions for the number of code words of arbitrary weight. Finally, bounds for error masking probability are obtained
Keywords :
Hamming codes; binary sequences; logic testing; probability; Hamming code; arbitrary weight; code words; compact testing; error masking; invalid sequence; masking probability; probability distribution; signature analysis; Binary sequences; Cybernetics; Floors; Probability distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1995., Proceedings of the Fourth Asian
Conference_Location :
Bangalore
Print_ISBN :
0-8186-7129-7
Type :
conf
DOI :
10.1109/ATS.1995.485352
Filename :
485352
Link To Document :
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