Generalized modular design of testable m-out-of-n code checker

Author

Pada Biswas, Gosta ; Sen Gupta, Indranil

Author_Institution

Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India

fYear

1995

fDate

23-24 Nov 1995

Firstpage

322

Lastpage

326

Abstract

A testable design of a programmable m-out-of-n code checker is reported in this paper. The checker is modular in nature and can be easily extended by cascading. Basically, a cellular automaton (CA) structure is taken whose combinational logic port (CL-part) is modified in such a way that all the 1´s in the initial state (seed) get accumulated in the rightmost cells. This CA is then transformed into an iterative array of combinational logic cells. To make the resulting structure testable for all stuck-at and unidirectional faults, it is partitioned into a number of identical blocks the outputs of which are combined to produce two complementary outputs

Keywords

VLSI; cellular automata; combinational circuits; fault diagnosis; fault location; logic arrays; logic testing; cellular automaton; combinational logic cells; combinational logic port; complementary outputs; initial state; iterative array; modular design; stuck-at faults; testable m-out-of-n code checker; unidirectional faults; Automata; Automatic testing; Circuit faults; Circuit testing; Computer errors; Computer science; Electrical fault detection; Fault tolerant systems; Logic arrays; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1995., Proceedings of the Fourth Asian

Conference_Location

Bangalore

Print_ISBN

0-8186-7129-7

Type

conf

DOI

10.1109/ATS.1995.485355

Filename

485355