DocumentCode :
3243217
Title :
Striation Patterns Classification of Tool Marks Based on Extended Fractal Analysis
Author :
Min Yang ; Li, Mou ; Li Mou ; Wei-Dong Wang
Author_Institution :
Inst. of Forensic Sci., Guangdong Police Coll., Guangzhou
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
1
Lastpage :
5
Abstract :
Currently, optical device, such as microscopes and CCD cameras, are utilized for identification of tool marks in the field of forensic science which mainly depend on the experience of forensic scientists. A new approach using extended fractal analysis technology to classify tool marks such as striation patterns is presented. it computes four directional multi-scale extended fractal parameters and the maximum direction fractal feature, then performs a supervised classification. Experimental results demonstrate that this method provides a classification scheme that performs well than the traditional schemes and is effective for classification of tool marks.
Keywords :
feature extraction; image classification; CCD cameras; directional multiscale extended fractal parameters; extended fractal analysis; forensic science; maximum direction fractal feature; microscopes; optical device; striation pattern classification; supervised classification; tool mark classification; tool mark identification; Algorithm design and analysis; Forensics; Fractals; Layout; Optical microscopy; Pattern analysis; Pattern classification; Shape; Surface fitting; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. CCPR '08. Chinese Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2316-3
Type :
conf
DOI :
10.1109/CCPR.2008.93
Filename :
4663046
Link To Document :
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