DocumentCode :
3243368
Title :
ATML in Manufacturing Test Systems using National Instruments Teststand
Author :
Rosenthal, David
Author_Institution :
Instrum. Eng., Thornton, CO
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
446
Lastpage :
450
Abstract :
Automatic Test Markup Language (ATML) is a means to communicate test outcomes up and down the maintenance chain. The ATML family of standards was developed in the belief that a useful exchange of test information among product life-cycle phases would improve the inefficiencies of testing in both time and budget. (Seavey & Einspanjer, 2005). In a NetCentric Environment, the promise of increased compatibility leverages usability, support and maintenance to improve the future productivity of automatic test system (ATS) investments.
Keywords :
automatic test equipment; maintenance engineering; product life cycle management; production engineering computing; ATML; ATS; Automatic Test Markup Language; automatic test system; compatibility leverages usability; maintenance chain; manufacturing test systems; national instruments teststand; product life-cycle phases; Automatic testing; Instruments; Investments; Life testing; Manufacturing; Markup languages; Productivity; Standards development; System testing; Usability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283704
Filename :
4062417
Link To Document :
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