Title :
PXI Express Based JTAG / Boundary Scan ATE for Structural Board and System Test
Author :
Ehrenberg, Heiko
Author_Institution :
GOEPEL Electron. LLC, Austin, TX
Abstract :
Being well established as a valuable test and debug access methodology in the commercial electronics business, JTAG/ boundary scan as defined in IEEE Std. 1149.1 continues to advance into government and military applications as well. This test technology can be implemented in test systems based on various hardware platforms. This paper presents benefits a high speed tester platform such as PXI express provides for structural test and in-system programming applications based on JTAG / boundary scan access.
Keywords :
automatic test equipment; boundary scan testing; peripheral interfaces; IEEE Std. 1149.1; JTAG; PXI express; boundary scan ATE; commercial electronics business; debug access methodology; high speed tester platform; in-system programming; structural board; system test; Automatic testing; Circuit testing; Electronic equipment testing; Field programmable gate arrays; Logic testing; Pins; Printed circuits; Standards development; Standards publication; System testing;
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2006.283708
