• DocumentCode
    3243762
  • Title

    Nanoscale simulation of heat conduction in semiconductor devices

  • Author

    Sinha, Sanjiv ; Schelling, P.K. ; Phillpot, S.R. ; Goodson, K.E.

  • Author_Institution
    Dept. of Mech. Eng., Stanford Univ., CA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    734
  • Abstract
    Localized heat generation, with dimensions of the order of 10 nm, takes place in the drain regions of current transistors, resulting in an increase in thermal resistance near such a hotspot. We present a model based on the phonon Boltzmann transport equation (BTE) that agrees well with data for hotspots in simple geometries. The model suggests that scattering rates of optical phonons are key to the conduction physics. We use molecular dynamics to obtain phonon relaxation rates and show their dependence on the energy density in the hotspot. This work improves the constitutive modeling of heat flow in nanoscale devices.
  • Keywords
    Boltzmann equation; elemental semiconductors; molecular dynamics method; phonon spectra; semiconductor device models; semiconductor thin films; silicon; thermal resistance; thin film transistors; constitutive modeling; drain region; energy density; heat conduction; heat flow; hotspot; localized heat generation; molecular dynamics; nanoscale devices; nanoscale simulation; optical phonon scattering rate; phonon Boltzmann transport equation; phonon relaxation rate; semiconductor devices; thermal resistance; transistors; Acoustic scattering; Immune system; Nanoscale devices; Optical attenuators; Optical films; Optical scattering; Phonons; Semiconductor devices; Silicon; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
  • Print_ISBN
    0-7803-8357-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.2004.1318381
  • Filename
    1318381