• DocumentCode
    3243878
  • Title

    VXI Standard Revision to Meet Today´s Technology Requirements

  • Author

    Stora, Michael ; Davis, Bob

  • Author_Institution
    IEEE l&M Soc., Boonton, NJ
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    578
  • Lastpage
    583
  • Abstract
    This standard describes the electrical and mechanical specifications of the IEEE-1155 VME extensions for Instrumentation (VXI) Standard that supports an integrated legacy parallel bus and serial bus architecture adopted from VME International Trade Association (VITA) Standard 41.3 [1], and LAN extensions for Instrumentation (LXI) Consortium [2]. It also addresses the definition of: (a) a C-size pluggable virtual power module; (b) the direct coupling option of the instrument module to the IEEE-P1505 receiver fixture interface (RFI) [3]; (c) enhanced cooling structure; (d) advanced VME controller/switch fabric modules; (e) VME64 connector compliance implementation; (f) improved noise and ripple isolation; (g) cooling air flow measurement; (h) IEEE-1149.1/4 test bus boundary scan/mixed signal [4]; and (i) LXI protocol/control line implementation. The specification also details: instrument module footprints, connector mechanics and electrical I/O between the backplane and instrument module, cooling/ EMI requirements; VXI mainframe mechanical structure, cooling and environmental requirements; and the VXI backplane mechanical and electrical requirements.
  • Keywords
    input-output programs; local area networks; system buses; EMI requirements; IEEE-1155 VME extensions for Instrumentation specifications; IEEE-P1505 receiver fixture interface; LAN extensions for Instrumentation; VME International Trade Association Standard; VXI mainframe mechanical structure; VXI standard revision; advanced VME controller-switch fabric modules; cooling air flow measurement; noise-ripple isolation; Backplanes; Connectors; Cooling; Fixtures; Instruments; International trade; Local area networks; Multichip modules; Switches; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283731
  • Filename
    4062444